Proven Performance in the Worst of Environments
Solutions>Extreme Environment Application
Live scan devices require unique design and capabilities to operate in the most extreme environments. The i3 digID xs is designed specifically for these applications. Add in the portability of the digID xs with its proven performance in the worst of environments, this then becomes the device of choice.
Designed and tested to MIL-STD-810F durability specifications through an independent testing lab, the digID xs complies with the following specifications:
- High Temperature storage (Method 501.4)
- Low Temperature storage (Method 502.4)
- Rain (Method 506.4)
- Humidity (Method 507.4)
- Vibration (Method 514.5)
Shock (Method 516.5) - Drop (Method 516.5)
- Blowing Dust (Method 510.4)
- High Temperature Operations (Method 504.1)
- Solar Radiation (Method 505.4)
- Salt Fog: (Method 509.4)
With no moving parts, a sealed polymer casing, and shock-absorbing reinforcements, the digID xs is built to go anywhere. A sealed exterior and coated circuitry makes the xs resistant to water and corrosion. The single connectivity USB cable for device power, data and control provides the best portable slap solution in the market. Added protection is provided by the adjustable scan cover and also acts as a shield for even better quality scans.